Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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Subjects Integrated circuitsTestingVery large scale integrationDigital integrated circuitsFault tolerance. Please enter the message.
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Mustaq Ahmad rated it liked it Feb 03, Matthias Pflanz No preview available – This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. External Links Publisher description Table of contents.
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Test Generation for Sequential Circuits — Ch. Rededa rated it really liked it Nov 21, Similar Items Related Subjects: Test Generation for Combinational Logic Circuits. Write a review Rate this item: Extensive references follow each chapter, vigital further research in a particular area readily available.